Scanning Electron Microscope (SEM) equipped with material characterization tools such as Energy Dispersive Spectroscopy (WDS). (See attached performance specification.)
This is a Source Sought Notice Only – The 809th Science and Engineering Laboratory (809 MXSS/MXDTAC) Group at Hill Air Force Base, Utah requires a Variable Pressure Environmental Scanning Electron Microscope system (VP-ESEM). This requirement is not currently anticipated to be solicited on a small business set-aside basis, given correspondence with the Original Equipment Manufacturer.
The decision to award a sole source order is based on the fact that FEI is the manufacturer of the FE-SEM electron microscope and is the only known company authorized to provide the personnel to perform preventative maintenance service, and to provide certified replacement non-consumable parts, software updates, and notifications to maintain the electron microscope.
JEOL ELECTRON MICROSCOPE PM BASE PLUS 4 Solicitation ID/Procurement Identifier: 36C26024P0242 Ultimate Completion Date: Wed Feb 28 18:00:00 GMT 2029
THERMOFISHER TECNAI 12BT ELECTRON MICROSCOPE SN: D1018 Solicitation ID/Procurement Identifier: 12505B24Q0044 Ultimate Completion Date: Tue Apr 08 17:00:00 GMT 2025
1 YEAR MAINTENANCE SERVICE AGREEMENT - SIGMA ZEISS SCANNING ELECTRON MICROSCOPE POP: 3/1/2024 - 2/28/2025 Solicitation ID/Procurement Identifier: 75N92024Q0945 Ultimate Completion Date: Fri Feb 28 18:00:00 GMT 2025
PROCUREMENT OF A BASE PLUS FOUR (4) OPTION YEARS SERVICE PLAN LEVEL 2 FOR THE HITACHI HT-7800 (ASSET HT7800 6103-03) AND SU800 (ASSET SU8000 0101-03) ELECTRON MICROSCOPE SYSTEMS. Solicitation ID/Procurement Identifier: RFQ-NIAID-24-2191519 Ultimate Completion Date: Wed Feb 28 18:00:00 GMT 2029
